Contact Probes are wire probes with extremely small diameters, suitable for inspecting electronic components with narrow pitch electrodes.
Their conductors use palladium alloys, copper-silver alloys, tungsten, rhenium tungsten, and beryllium copper.

Compared to spring-type or cantilever-type probes, these are probe pins with excellent support for narrow pitches and area arrays associated with higher integration.

Contact probes using palladium alloys for their conducting materials have also been newly added to our lineup.

  • Tungsten
  • Rhenium tungsten
  • Beryllium copper
  • Palladium alloy
  • Polyurethane resin (UE)
  • Polyester imide resin (EI)
  • Polyester resin (PE)
  • Polyamide imide resin (AI)
Conductor configurations 0.02mm~0.110mm




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Ideal for use as wiring materials in various types of precision devices. Their extremely small diameters and high straightness allow them to improve wiring workability.

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